Publications

Amberg, M., Lüthi, M. und Vetter, T. (2010) «Local regression based statistical model fitting», in Pattern Recognition : 32nd DAGM Symposium, Darmstadt, Germany, September 22-24, 2010. Proceedings. Berlin: Springer (Lecture Notes in Computer Science), S. 452-461. doi: 10.1007/978-3-642-15986-2_46.   edoc