Publications

Amberg, M., Lüthi, M. and Vetter, T. (2010) ‘Local regression based statistical model fitting’, in Pattern Recognition : 32nd DAGM Symposium, Darmstadt, Germany, September 22-24, 2010. Proceedings. Berlin: Springer (Lecture Notes in Computer Science), pp. 452-461. doi: 10.1007/978-3-642-15986-2_46.   edoc